Electron microscopy (EM) has become an indispensable tool for investigating the nanoscale structure of a large range of materials, across physical and life sciences. It is vital for characterisation ...
A comparison of experimental annular dark field (ADF)-scanning transmission electron microscopy (STEM) and electron ptychography in uncorrected and aberration-corrected electron microscopes. In the ...
Since the first transmission electron microscope was sold in 1935, microscopes that use electrons--rather than light waves--to image objects have brought into focus levels of detail that were ...
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