First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...

Atomic force microscopy (AFM) is a way to investigate the surface features of some materials. It works by “feeling” or “touching” the surface with an extremely small probe. This provides a ...

Scientists at the Department of Energy's Oak Ridge National Laboratory have reimagined the capabilities of atomic force microscopy, or AFM, transforming it from a tool for imaging nanoscale features ...

Reflected light is a valuable tool for studying the quality of manufactured metal parts for quality control purposes, with the nature of the surface's crystal grains affecting the patterns of returned ...

A new microscopy approach revealed that the glycocalyx, a sugar coating surrounding cells, changes its molecular arrangement ...

Microscopy is an imaging technique that enables us to see a world that would otherwise be invisible to us. Once upon a time, visualizing cells, microbes and other entities not perceptible to the naked ...